Authors
^{1} Department of Computer Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran
^{2} Department of Mechanical and Aerospace Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran
Abstract
Keywords
[1] Binnig, G., Quate, CF., and Gerber, C., “Atomic Force Microscope”, Physical Review Letters 56.9, 1986, pp. 930.
[2] Timoshenko, SP., Goodier, JN., “Theory of Elasticity”, New York: McGraw Hill, 1951.
[3] Meirovitch, L., Elements of vibration analysis. McGraw Hill, 1975.
[4] Rao, JA., “Advanced Theory of Vibration”, New York: Wiley, 1992.
[5] Turner, JA., Wiehn, JS., “Sensitivity of flexural and torsional vibration modes of atomic force microscope cantilevers to surface stiffness variations”, Nanotechnology 12.3, 2001, pp. 322.
[6] Rabe, U., Janser, K., and Arnold, W., “Vibrations of free and surface-coupled atomic force microscope cantilevers: theory and experiment”, Review of Scientific Instruments 67.9, 1996, pp. 3281-3293.
[7] Chang, WJ., Chu, SS., “Analytical solution of flexural vibration responses on taped atomic force microscope cantilevers”, Physics Letters A309.1, 2003, pp. 133-137.
[8] Song, Y., Bhushan, B., “Simulation of dynamic modes of atomic force microscopy using a 3D finite element model”, Ultramicroscopy 106.8, 2006, pp. 847-873.
[9] Arafat, HN., Nayfeh, AH., and Abdel-Rahman, EM., “Modal interactions in contact-mode atomic force microscopes”, Nonlinear Dynamics, Vol. 54, No. 1-2, 2008, pp. 151-166.
[10] Wang, HC., “Generalized hyper geometric function solutions on the transverse vibration of a class of nonuniform beams” Journal of Applied Mechanics, Vol. 34, 1967, pp. 702.
[11] Auciello, NM., “Transverse vibrations of a linearly tapered cantilever beam with tip mass of rotary inertia and eccentricity”,. Journal of Sound and Vibration 194.1, 1996, pp. 25-34.
[12] Rank, C., Pastushenko, V., Kienberger, F., Stroh, CM., and Hinterdorfer, P., “Hydrodynamic damping of a magnetically oscillated cantilever close to a surface”, Ultramicroscopy 100.3, 2004, pp. 301-308.
[13] Vancur, C., Dufour, I., Heinrich, S.M., Josse, F., and Hierlemann, A., “Analysis of resonating microcantilevers operating in a viscous liquid environment”, Sensors and Actuators 141, 2008, pp. 43–51.
[14] Korayem, MH., Ebrahimi, N., “Nonlinear dynamics of tapping-mode atomic force microscopy in liquid”, Journal of Applied Physics 84301, 2011, pp. 109-117.
[15] Kim, Y., Kang, SK., Choi, I., Lee, J., and Yi, J., “Dependence of image distortion in a liquid-cell atomic force microscope on fluidic properties”, Applied Physics Letters173121, Vol. 88, No. 17, 2006.
[16] Kim, Y., Yi, J., “Enhancement of topographic images obtained in liquid media by atomic force microscopy”, Journal of Physical Chemistry B, Vol. 110, No. 41, 2006, pp. 20526–32.
[17] Biswas, S., Hirtz, M., Lenhert, S., and Fuchs, H., “Measurement of DPN-Ink Viscosity using an AFM Cantilever”, In: Nanotechnology Conference and Expo, NSTI-Nanotech, Vol. 2, 2010, pp. 231-4.
[18] Damircheli, M., Korayem, MH., “Dynamic analysis of the AFM by applying the Timoshenko beam theory in the tapping mode and considering the impact of the interaction forces in a liquid environment”, Canadian Journal of Physics, 2013.
[19] Korayem, MH., Damircheli, M., “The effect of fluid properties and geometrical parameters of cantilever on the frequency response of atomic force microscopy”, Precision Engineering, 2013.